作者：
作者單位：
刊名：The Refractories Engineer
ISSN：1362-4547
出版年：2011-01-05
卷：
期：1
起頁：8
止頁：8
分類號：TQ175.7
語種：英文
關鍵詞：
內容簡介CERAM, a global expert in materials testing, analysis and consultancy, has extended the scope of its microstructural and mineralogical analysis services with the acquisition of a new X-Ray Diffractometer (XRD). The state-of-the-art XRD system provides faster analysis turnaround, increased resolution, non-powder sample analysis and improved Rietveld refinement, as well as three new techniques: X-Ray Reflectivity (XRR); Grazing Incidence XRD (GIXRD); and Micro-Diffraction (m-XRD).
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